AXAF Project Science: EIPS Catalog

There is a programming error in the calculations of "line purity". The error affects any targets with more than one line; the more lines the worse the error. The plots and tables for "line purity" from the online catalog should not be used until corrections have been made.

• The tables (ASCII) and plots (GIF) of spectra are arranged in sets of voltages that are multiples of the K or L edge energies.
• Plots of unfiltered spectra are available where the spectra from all voltages are overlapped (plot1) or appear on separate plots (plot2). The plots of filtered spectra are overlapped.
• Line purity results give the line fraction (number of counts in the line to that in the 0.1 - 10.0 keV band) and the detected photon energy dispersion.

Target: O (SiO2), Z=8

Set 1: K-edge group, unfiltered.

Target Voltages (kV):       1.0634   1.5951   2.1268   2.657

PEIS Source Model:
table
plot1
plot2

At Focal Plane:
table
plot1
plot2
ACIS, Backside-Illuminated:
table
plot1
plot2
ACIS, Frontside-Illuminated:
table
plot1
plot2
HRC, CsI MCP + UV shield:
table
plot1
plot2

Set 2: K-edge group, Cr filter.

Target Voltages  (kV):      0.8032  1.2048   1.6064  2.008
Filter Thickness (micron):  0       0.423    0.846   1.69    2.54    3.39    4.23

PEIS Source Model (filtered):
table
plot

At Focal Plane:
table
plot   line purity -  K
table
plot
ACIS, Backside-Illuminated:
table
plot   line purity -  K
table
plot
ACIS, Frontside-Illuminated:
table
plot   line purity -  K
table
plot
HRC, CsI MCP + UV shield:
table
plot   line purity -  K
table
plot

Editor: Dr. Douglas Swartz System Administrator: Mr. Bob Dean Privacy Policy and Important Notices Accessibility Statement